VTRAN™ Release 9.5 Translators
The 9.5 Release of VTRAN™ supports numerous translation paths between popular simulation, ATPG and tester vector formats. Included in this is support for the handling of scan data, as well as multiple timing sets. Scan data support is particularly important for vector files created by many of the scan insertion, BIST and other ATPG programs on the market today. The following matrix summarizes the availability of canned readers and writers for some of the more popular translation paths. The Support column indicates, for cycle-based formats, whether VTRAN™ supports scan, loop or repeat syntax. For those testers that do not indicate scan or loop support, VTRAN™ will automatically flatten any of these structures that may have been in the input file before translation. VTRAN™ can translate any format for which a Reader module exists to any format for which a Writer module exists. Please note that this list is not exhaustive, it merely highlights some of the more popular formats - see VTRAN™ User's Guide Appendix C, D and E for a complete listing.
VTRAN™ provides many powerful facilities for performing these translations which can vary significantly in complexity and user involvement. Translations from cycle-based formats like WGL, STIL (IEEE Standard 1450-1999) or TDL_91 to either simulator or tester formats typically are straightforward and require very little input from the user. On the other hand, for translations from event-based formats like Verilog VCD/EVCD format to simulators/testers, the user must provide information about pin directions and timing since this information is not contained explicitly in the VCD vector file itself. Translations from VCD to any of the cycle-based formats (all of the tester formats) will also require the use of one of the ALIGN processes, or the TEMPLATE_CYCLIZATION process to cyclize the event-based data. For additional information on these, and other format translations, together with examples, see the INTERFACES directory which can be downloaded from the Download web page. Also, check our Application Notes web page.
Vector Format Translation Matrix
|ATPG and EDA Formats|
|WGL||scan, loops, repeats||Yes||Yes|
|STIL||scan, loops, repeats||Yes||Yes|
|TDL_91||scan, loops, repeats||Yes||Yes|
|TSTL2||scan, loops, repeats||Yes||Yes|
|FTDL||scan, loops, repeats||Yes||Yes|
|Chroma||scan, loops, repeats||Yes||Yes|
|Credence SWAV||scan, loops, repeats||Yes||Yes|
|Teradyne J750||scan, loops, repeats||Yes||Yes|
|Teradyne J971/3||scan, repeats||Yes||Yes|
|Teradyne Catalyst||scan, loops, repeats||Yes||Yes|
|Teradyne FLEX+||scan, loops, repeats||Yes||Yes|
|Agilent 93000||scan, loops, repeats, XMODE||Yes||Yes|
|IMS MEM Format||scan, repeats||Yes||Yes|
|Advantest T66xx T3xx||scan, loops, repeats||Yes||Yes|
|Advantest T2000||scan, loops, repeats||Yes||Yes|
|Q-Star IDDQ/ISSQ||Control Insertion||Yes|
Source III's Simulation and Test Data Management tools focus on the creation, translation and analysis for vector data used or generated by logic simulators, ATPG and ATE. Our premier product, VTRAN, links simulation/ATPG vector data to ATE and other CAE tools. VGEN provides a high-level language for quick and easy creation of simulation vector data, and VCAP performs verification/analysis of simulation data files. All Source III products are supported on Sun Solaris SPARC, Solaris X86 and Linux platforms (32 and 64-bit).
- VTRAN - a program which reads the state/time information from simulation or ATPG-generated data files, performs some optional processing on this data and then re-formats it for any of over 30 popular logic simulators and ATE. A powerful link between CAE and Test.
- VCAP - comprehensive simulation data comparison and analysis program.
- VGEN - a stimulus generation language which reduces the time required to create, modify, document, and maintain simulation stimulus files by up to 80%.
- DFTView - a powerful interface tool which connects high-level test languages WGL and STIL to popular graphical waveform display tools, enabling users to see, edit and validate the actual waveforms described in the test languages.