Your source for: Test vector translation, translate WGL vectors, Translation paths between popular simulation, ATPG and tester vector formats, WGL to test,
Translate STIL vectors, STIL to ATE, STIL to test, Simulation to test, ATPG to test, Translate VCD to ATE, VCD to test, Verilog testbench translation, WGL waveform display, STIL waveform display.

VTRAN™ Release 9.5 Translators

The 9.5 Release of VTRAN™ supports numerous translation paths between popular simulation, ATPG and tester vector formats. Included in this is support for the handling of scan data, as well as multiple timing sets. Scan data support is particularly important for vector files created by many of the scan insertion, BIST and other ATPG programs on the market today. The following matrix summarizes the availability of canned readers and writers for some of the more popular translation paths. The Support column indicates, for cycle-based formats, whether VTRAN™ supports scan, loop or repeat syntax. For those testers that do not indicate scan or loop support, VTRAN™ will automatically flatten any of these structures that may have been in the input file before translation. VTRAN™ can translate any format for which a Reader module exists to any format for which a Writer module exists. Please note that this list is not exhaustive, it merely highlights some of the more popular formats - see VTRAN™ User's Guide Appendix C, D and E for a complete listing.

VTRAN™ provides many powerful facilities for performing these translations which can vary significantly in complexity and user involvement. Translations from cycle-based formats like WGL, STIL (IEEE Standard 1450-1999) or TDL_91 to either simulator or tester formats typically are straightforward and require very little input from the user. On the other hand, for translations from event-based formats like Verilog VCD/EVCD format to simulators/testers, the user must provide information about pin directions and timing since this information is not contained explicitly in the VCD vector file itself. Translations from VCD to any of the cycle-based formats (all of the tester formats) will also require the use of one of the ALIGN processes, or the TEMPLATE_CYCLIZATION process to cyclize the event-based data. For additional information on these, and other format translations, together with examples, see the INTERFACES directory which can be downloaded from the Download web page. Also, check our Application Notes web page.

Vector Format Translation Matrix