Simulate Translate Test

In today’s DFT tools, the use of scan insertion to improve test coverage and reduce test pattern volume is very common. All of the major ATPG tool vendors (Synopsys, Cadence and Mentor) offer this approach in their product suites. And indeed this approach has proven to be very effective, together with some other pattern compression techniques, in helping design/test engineers meet the challenges for today’s complex devices. The way in which scan is handled within WGL files is often a source of confusion for engineers using this language as the medium for pattern expression. One primary reason for this confusion is that the scan data expressed in the WGL file is cell data, not shift data. This means that when translating these patterns into an actual test program for ATE a mapping must be done by the translation tool because real device test programs must have shift data. It is…
Today’s logic simulators are some of the most advanced, capable of comprehensive, timing-accurate logic and timing simulations. But many of the languages that utilizes these simulators fail to take advantage of these capabilities. VGEN was created to provide a high level language interface that is fully customizable, able to be tailored to the specific needs of the simulators and testers. The value of this is efficiency. VGEN has been shown to reduce the amount of time spent modifying, creating, and documenting simulation stimulus files by as much as 80%, because it is capable of a variety of functions that are invaluable for those working with CAE/CAD tools, which generally provide sub-adequate solutions for Integrated Circuit and system level designers. VGEN is a feature rich generic stimulus language solution, with features that include: Signal grouping and vectorizing Subroutines with parameter passing Complex logic/arithmetic syntax for algorithmic pattern generation Pattern looping and…
IC (including ASICs) Design-to-test flow is fraught with issues. Although the current methodologies are well established, the programs and test tools are generally inefficient, and in some cases require significant manual inputs and effort in order to move forward in the process. Improving Efficiency, Translations, Analysis and More Every product in Source III’s product line was designed to provide IC design-to-test methodology help to engineers looking for a more streamlined, user friendly, and efficient translation flow. Our products each seek to provide valuable resources to design and test engineers that can be used again and again throughout the chip development process. Two of our four products in particular are worth highlighting: VTRAN – VTRAN is a vector translation program that translates over 30 different popular simulation and ATE vector Formats. VTRAN is used by dozens of the leading names in the electronics and semiconductor industries, translating WGL, STIL, VCD/EVCD to…

Analyze Pin Timing Behavior with VCAP

Monday, 05 October 2015 18:29
One of the challenges facing ASIC test engineers (and all IC test engineers) is analyzing simulation results files from design, especially with regards to pin timing and behavior. Often this analysis has to be completed manually, where the user has to spend hours reviewing simulation data files, determining propagation delays, and extracting input signal behaviors. It can be time consuming, and in some cases impossible depending on the limitations of your software. To address that challenge, Source III created VCAP, a comprehensive simulation data analysis tool with a variety of capabilities to assist IC, and ASIC test engineers with their simulation results analysis. VCAP has many additional features, but today, we wanted to highlight some of the most valuable capabilities as they relate to analysis of pin timing and behavior, which include capabilities such as: Identifying the waveform behavior of input signals Reporting minimum and maximum output delays. Checking for…
Many of our clients use our DFTView product on a Load Sharing Facility (LSF) Platform. To do so does require a few small changes: For this to work correctly your DISPLAY must be properly configured when you connect to your compute server — by passing the -I flag to bsub LSF will typically take care of this for you, for example:   bsub -I DFTView &   You can also try running an Xterm directly on your compute host - this should provide you with an Xterm window where your display settings would again be set for you.  In this case, you could then just run DFTView interactively within that Xterm:   bsub xterm -or- lsrun sh -c "xterm &"   In some situations you may need to use X11 forwarding over ssh when submitting a job - this requires the additional -XF option, and may require you to provide your password and/or…